Title :
Thermal fatigue analysis of a CBGA package with lead-free solder fillets
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
Abstract :
Reliability performance of a ceramic ball grid array (CBGA) package using lead-free solder fillets is numerically examined from the viewpoint of viscoplastic deformation and thermal fatigue life. Three lead-free solder alloys, nearly peritectic antimony-tin (Sb5-Sn95), eutectic silver-tin (Ag3.5-Sn96.5) and eutectic zinc-tin (Zn9-Sn91), were considered in this study. A finite element model was used to analyze a 32 mm single chip module (SCM) CBGA package under a 0/100°C accelerating thermal cycling (ATC) load with a frequency of 2 cycles per hour. Model validation shows that the predicted mean solder joint fatigue life of a standard CBGA package using Pb37-Sn63 solder fillets has good agreement with experimental data. The prediction results also indicate that these lead-free alloys can be used as alternative solder fillet materials to improve the resistance to creep and fatigue of CBGA solder joints compared to that of the standard CBGA package. The predicted mean fatigue life of a CBGA package with lead-free solder fillets of Sb5-Sn95 is 1.69×, Ag3.5-Sn96.5 is 2.62×, and Zn9-Sn91 is 3.01× relative to that of Pb37-Sn63 soldered CBGAs
Keywords :
antimony alloys; ball grid arrays; ceramic packaging; creep; eutectic alloys; fatigue; finite element analysis; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; integrated circuit reliability; life testing; plastic deformation; silver alloys; soldering; thermal analysis; thermal stress cracking; thermal stresses; tin alloys; viscoplasticity; zinc alloys; 0 to 100 C; 32 mm; AgSn; CBGA package; CBGA solder joints; Pb-Sn solder fillets; PbSn; SbSn; ZnSn; accelerating thermal cycling load; ceramic ball grid array package; creep resistance; eutectic Ag-Sn solder; eutectic Zn-Sn solder; eutectic silver-tin solder; eutectic zinc-tin solder; fatigue resistance; finite element model; lead-free alloys; lead-free solder alloys; lead-free solder fillets; mean fatigue life; mean solder joint fatigue life; model validation; nearly peritectic Sb-Sn solder; nearly peritectic antimony-tin solder; reliability; single chip module; solder fillet materials; standard CBGA package; thermal fatigue analysis; thermal fatigue life; viscoplastic deformation; Acceleration; Ceramics; Electronics packaging; Environmentally friendly manufacturing techniques; Fatigue; Finite element methods; Frequency; Lead; Soldering; Thermal loading;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 1998. ITHERM '98. The Sixth Intersociety Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-4475-8
DOI :
10.1109/ITHERM.1998.689545