Title :
Optimization of propagation in interval constraint networks for tolerance design
Author :
Ciarallo, Frank W. ; Yang, Christopher C.
Author_Institution :
Dept. of Syst. & Ind. Eng., Arizona Univ., Tucson, AZ, USA
Abstract :
This paper proposes a hierarchical internal constraint network and interval propagation techniques for automatic tolerance design. The nodes in interval constraint networks represent the entities, the attributes, and the functional requirements of the mechanical design or the constraint functions. The arcs represent the relationships between the entities, the attributes, the functional requirements and the constraint functions. We developed the forward propagation technique for tolerance analysis and the backward propagation technique for tolerance synthesis. In tolerance analysis, given the entity tolerances, the goal is to ensure that the functional requirement tolerances are met. In tolerance synthesis, given the functional requirement tolerances, the goal is to synthesize a new set of entity tolerances. In backward propagation, the minimization of the manufacturing cost is also considered. During backward propagation, the tolerances of entities, which have a smaller impact on manufacturing costs, will be tightened first. Using this mechanism, we ensure the constraints are satisfied and the manufacturing costs are minimized
Keywords :
constraint handling; costing; hierarchical systems; optimisation; production control; spatial reasoning; tolerance analysis; backward propagation; constraint functions; constraint satisfaction problem; forward propagation; hierarchical interval constraint networks; interval propagation; manufacturing cost; optimization; production control; tolerance analysis; tolerance synthesis; Computer science; Constraint optimization; Cost function; Design optimization; Equations; Intelligent networks; Manufacturing; Product design; Statistical analysis; Tolerance analysis;
Conference_Titel :
Systems, Man, and Cybernetics, 1997. Computational Cybernetics and Simulation., 1997 IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-4053-1
DOI :
10.1109/ICSMC.1997.638348