DocumentCode
318094
Title
A method to measure EMI due to electric field coupling on PCB
Author
Pong, Bryan M H ; Lee, Angus C M
Author_Institution
Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
Volume
2
fYear
1997
fDate
3-6 Aug 1997
Firstpage
1007
Abstract
A new method to measure electric field coupling between PCB copper traces is presented. This method enables measurement of noise from waveforms obtainable from breadboard prototypes, which is available in an early stage in the design process. The measurement result can then be analyzed and provide information for further PCB design. This method is verified by experiments and applied to an off-line flyback converter
Keywords
DC-DC power convertors; electric fields; electric noise measurement; electromagnetic interference; printed circuit layout; EMI measurement; PCB copper traces; PCB design; breadboard prototype waveforms; electric field coupling; noise measurement; off-line flyback converter; Circuit testing; Conductors; Coupling circuits; Design engineering; Electric variables measurement; Electromagnetic interference; Magnetic field measurement; Noise measurement; Prototypes; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Conversion Conference - Nagaoka 1997., Proceedings of the
Conference_Location
Nagaoka
Print_ISBN
0-7803-3823-5
Type
conf
DOI
10.1109/PCCON.1997.638393
Filename
638393
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