• DocumentCode
    3182017
  • Title

    Electronic structures of Ga1-xInxNyAs1-y/GaAs compressively strained quantum wells

  • Author

    Fan, W.J. ; Yoon, S.F.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    354
  • Lastpage
    357
  • Abstract
    The electronic structures of the Ga1-xInxN yAs1-y/GaAs compressive strained quantum wells (QWs) are investigated using a 6×6 k·p Hamiltonian including the heavy hole, light hole and spin-orbit splitting band. By varying the well width and mole fraction of N in the well material, the effects of quantum confinement and compressive strain are examined. The curves of dependence of transition energy on well width and N mole fraction are obtained. The valence subband energy dispersion curves and TE and TM squared optical transition matrix elements of three possible quantum well structures for emission at 1.3 μm are given
  • Keywords
    III-V semiconductors; band structure; gallium arsenide; indium compounds; internal stresses; k.p calculations; semiconductor quantum wells; spin-orbit interactions; valence bands; 1.3 mum; 6×6 k·p Hamiltonian; Ga1-xInxNyAs1-y/GaAs compressively strained quantum wells; GaInNAs-GaAs; N mole fraction; TE squared optical transition matrix elements; TM squared optical transition matrix elements; compressive strain; electronic structure; heavy hole; light hole; quantum confinement; quantum well structures; spin-orbit splitting band; transition energy; valence subband energy dispersion curves; well width; Annealing; Capacitive sensors; Free electron lasers; Gallium arsenide; Lattices; Optical materials; Quantum well lasers; Semiconductor materials; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 2001. IPRM. IEEE International Conference On
  • Conference_Location
    Nara
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-6700-6
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2001.929131
  • Filename
    929131