DocumentCode :
3182091
Title :
Solder Fatigue Study through Finite Element Analysis in a Molded Board Level BGA Module
Author :
Zhang, Jack ; Ji, Qing ; Rector, Lou
Author_Institution :
Henkel Technol., Irvine
fYear :
2007
fDate :
26-28 June 2007
Firstpage :
1
Lastpage :
6
Abstract :
Eutectic solders are prone to cold flow and creep in thermal cycle process and therefore prone to fatigue failures. In this paper, eutectic solder fatigue in a molded board level BGA module was studied through finite element analysis. Particularly, the effects of underfilling molding compounds to the stresses and fatigue life of solder balls were investigated. A global finite element model was built to map out the most likely first-fail solder ball. The life cycle of this solder ball was further studied through a more detailed localized finite element model. Improvement of the fatigue life of this solder ball was investigated through optimizing materials properties of the underfilling molding compound.
Keywords :
ball grid arrays; eutectic alloys; finite element analysis; solders; board level BGA module; cold flow; eutectic solders; fatigue failures; fatigue life; finite element analysis; solder balls; solder fatigue; thermal cycle process; Capacitive sensors; Creep; Fatigue; Finite element methods; Flip chip; Packaging; Protection; Temperature; Testing; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Density packaging and Microsystem Integration, 2007. HDP '07. International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-1253-6
Electronic_ISBN :
1-4244-1253-6
Type :
conf
DOI :
10.1109/HDP.2007.4283570
Filename :
4283570
Link To Document :
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