DocumentCode
3182603
Title
Study on the Chip and Tool Tip Vibration of Thermosonic Flip Chip Bonding
Author
Wang, Fuliang ; Han, Lei ; Zhong, Jue
Author_Institution
Central South Univ., Changsha
fYear
2007
fDate
26-28 June 2007
Firstpage
1
Lastpage
5
Abstract
The vibration of flip chip and tool tip during thermosonic flip chip (TSFC) bonding were observed and the effect of bonding force on the chip vibration was studied. Firstly, the vibration velocity of tool tip and chip on TSFC bonding was monitored with a laser Doppler vibration measure system (LDV), and the "stall" phenomena was observed by the virtual value curve of vibration velocity, i.e., after the TSFC bonding started a fever milliseconds, the chip velocity decreases suddenly, while the tool tip velocity still increases. Stall indicated that the bump/pad interface has formed initial bonding strength. And then the frequency characters of the vibration velocity signals were studied. It is found that the 3rd harmonic of chip vibration velocity indicates the stall phenomena, i.e., when the 3rd harmonic appeared, the stall happens. Finally, effect of bonding force on vibration harmonics of chip were studied, and the experiment results show that the 3rd harmonic is appeared early when the bonding force is little, which indicated that the little bonding force is good for the initial bonding force formation.
Keywords
Doppler measurement; flip-chip devices; integrated circuit bonding; integrated circuit testing; measurement by laser beam; vibrations; TSFC bonding; bonding force effect; bump-pad interface; chip vibration velocity; flip chip vibration; laser Doppler vibration measure system; stall phenomena; thermosonic flip chip bonding; third harmonics; tool tip vibration; Bonding forces; Bonding processes; Flip chip; Friction; Optical propagation; Semiconductor device measurement; Temperature; Ultrasonic variables measurement; Velocity measurement; Vibration measurement; Laser Doppler Vibration measurement; bonding force; harmonic; thermosonic flip chip;
fLanguage
English
Publisher
ieee
Conference_Titel
High Density packaging and Microsystem Integration, 2007. HDP '07. International Symposium on
Conference_Location
Shanghai
Print_ISBN
1-4244-1253-6
Electronic_ISBN
1-4244-1253-6
Type
conf
DOI
10.1109/HDP.2007.4283596
Filename
4283596
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