• DocumentCode
    3182620
  • Title

    Interfacial Reactions between Sn-Cu Based Multicomponent Solders and Ni Substrates during Soldering and Aging

  • Author

    Zhao, Ning ; Ma, Hai-Tao ; Wang, Lai

  • Author_Institution
    Dalian Univ. of Technol., Dalian
  • fYear
    2007
  • fDate
    26-28 June 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The interfacial reactions between two Sn-Cu based multicomponent Pb-free solders, Sn-2Cu-0.5Ni and Sn-2Cu-0.5Ni-0.5Au (wt%), and Ni substrates during soldering and aging were investigated. Differential scanning calorimetry (DSC) was performed to measure the melting behaviors of the solders and determine the temperature of soldering. DSC tests show that the onset temperatures are 227.47degC and 224.78degC for Sn-2Cu-0.5Ni and Sn-2Cu-0.5Ni-0.5Au, respectively. Two intermetallic compounds (IMCs), Cu6Sn5 and (Cu,Ni)6Sn5, are formed in Sn-2Cu-0.5Ni solder. While the IMCs detected in Sn-2Cu-0.5Ni-0.5Au matrix are (Cu,Ni)6Sn5, (Cu,Au)6Sn5 and (Cu,Ni,Au)6Sn5. The IMC layer formed at both the solder/Ni interfaces is (Cu,Ni)6Sn5 with stick-lick morphology after soldering at 260degC. The interfacial IMC layers become planar when aged at 170degC for 500 h. However, cracks are found in the IMC layers at both joints when the aging time reaches 1000 h, which implies reliability problem may exist in the joints. Moreover, Au-containing IMCs are found on the top of the IMC layer in Sn-2Cu-0.5Ni-0.5Au/Ni joint after aging for 1000 h.
  • Keywords
    ageing; copper alloys; differential scanning calorimetry; nickel; soldering; solders; tin alloys; DSC; IMC layer; aging; copper; differential scanning calorimetry; intermetallic compounds; multicomponent solders; nickel; soldering; tin; Aging; Calorimetry; Intermetallic; Morphology; Performance evaluation; Soldering; Temperature; Testing; Tin; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Density packaging and Microsystem Integration, 2007. HDP '07. International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-1253-6
  • Electronic_ISBN
    1-4244-1253-6
  • Type

    conf

  • DOI
    10.1109/HDP.2007.4283597
  • Filename
    4283597