DocumentCode :
3183182
Title :
Studies of Solder Joint Reliability under Mechanical Bending Test on FR-4 PCBs with Sn-4.0Ag-0.5Cu Solder Paste
Author :
Chen, Si ; Sun, Peng ; Wei, Xicheng ; Cheng, Zhaonian ; Liu, Johan
Author_Institution :
Key Lab. of Adv. Display & Syst. Applic., Shanghai Univ., Shanghai
fYear :
2007
fDate :
26-28 June 2007
Firstpage :
1
Lastpage :
6
Abstract :
The mechanical bending test results, as well as the modeling and calculation data were presented in this study to characterize the solder joint reliability. Bending test was completed simply by loading a series of displacements on the FR-4 printed circuit board (PCB) with devices and solder joints in single direction. A special bending tester that can control displacement exactly by a cam system was designed and used for reliability study. The three group samples need to endure bend distortion with different deflections respectively, namely 3 mm, 4 mm, and 5 mm. The electrical resistance was probed every 3600 cycles by multimeter. When the resistance of solder joint got 10% increase, the failure can be defined. The experimental results indicate that the fatigue life decreased obviously with the displacement increased. By using optical microscope and SEM photographs, two kinds of failure model were found in solder joints. The majority failure model, which took place at the bottom corner of solder joint under the termination of resistor initially, and propagated into the solder matrix. The delamination appeared at the interface between the termination of resistor and its ceramic body. The finite element analysis was presented to support this experiment. The shear strain ranges under the different deflections were obtained from simulation. A Coffin-Mason equation of Sn-4.0Ag-0.5Cu from literature was used to compare with this experimental result and prove the feasibility of two points bending test in fatigue life prediction.
Keywords :
bending; copper alloys; failure analysis; fatigue testing; finite element analysis; mechanical testing; optical microscopy; printed circuits; reliability; scanning electron microscopy; silver alloys; soldering; solders; tin alloys; Coffin-Mason equation; FE simulation; FR-4 printed circuit board; SEM photographs; SnAgCu; bending tester; ceramic body; control displacement; electrical resistance; fatigue life prediction; finite element analysis; lead free solder matrix; mechanical bending test; optical microscope; resistor termination; shear strain distribution; shear stress distribution; solder joint reliability characterization; solder joints failure model; solder paste; Circuit testing; Displacement control; Electric resistance; Fatigue; Optical microscopy; Printed circuits; Resistors; Scanning electron microscopy; Soldering; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Density packaging and Microsystem Integration, 2007. HDP '07. International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-1252-8
Electronic_ISBN :
1-4244-1253-6
Type :
conf
DOI :
10.1109/HDP.2007.4283622
Filename :
4283622
Link To Document :
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