Title :
Logical effort based automated transistor width optimization methodology
Author :
Tiwari, Satish Chandra ; Gupta, Aneesh ; Singh, Kunwar ; Gupta, Maneesha
Author_Institution :
N.S.I.T.(Univ. of Delhi), Delhi, India
Abstract :
The paper presents a new automated transistor width optimization methodology for SoC. The methodology is based on Logical Effort theory. The proposed methodology is completely automation based and uses different procedural blocks written in TCL (tool command language). The methodology requires SPICE netlist as input and optimizes transistor widths for minimum delay. Both sequential (flip-flop) and combinational (basic logic gates) logic blocks were optimized successfully using the proposed methodology.
Keywords :
SPICE; authoring languages; circuit optimisation; flip-flops; logic circuits; logic gates; system-on-chip; transistor circuits; SPICE netlist; SoC; TCL; automated transistor width optimization methodology; basic logic gates; combinational logic blocks; flip-flop; logical effort theory; minimum delay; procedural blocks; sequential logic blocks; tool command language; transistor widths; Algorithm design and analysis; Delay; Flip-flops; Inverters; Logic gates; Optimization; Transistors; Flip-Flop; Logic Effort; VLSI; low power; optimization;
Conference_Titel :
Information and Communication Technologies (WICT), 2011 World Congress on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4673-0127-5
DOI :
10.1109/WICT.2011.6141396