• DocumentCode
    3183454
  • Title

    Measurement of the surface resistance of conductive textiles at microwave frequency

  • Author

    Shimasaki, Hitoshi ; Nakagawa, Toshihisa ; Akiyama, Masahiro

  • Author_Institution
    Dept. of Electron., Kyoto Inst. of Technol., Matsugasaki, Japan
  • fYear
    2009
  • fDate
    7-10 Dec. 2009
  • Firstpage
    2580
  • Lastpage
    2583
  • Abstract
    Textile samples which consist of conductive threads are characterized in a microwave frequency range. The configurations of the threads used in this study are traditional ones which have no metallic wires or filaments and have been used in decoration in clothing for hundred years. A half-wavelength microstrip line resonator is fabricated and the Q factors are measured for a copper strip line and for the strip of sample textile from the frequency responses. Difference of Q factors in the two cases leads to the relationship between the surface resistances of the sample and a copper sheet. Then the surface resistances of the samples as conductive sheets are listed and compared. It is found that the relative resistivity is less than four for some textiles. These conductive textiles using a traditional technology are expected to use in wearable electrical systems.
  • Keywords
    microstrip lines; microstrip resonators; textiles; Q factors; clothing; conductive sheets; conductive textile surface resistance; conductive threads; copper sheet; copper strip line; half-wavelength microstrip line resonator; microwave frequency; relative resistivity; wearable electrical systems; Conductivity measurement; Copper; Electrical resistance measurement; Frequency measurement; Microwave frequencies; Microwave measurements; Q factor; Surface resistance; Textiles; Yarn; Conductive threads; microstrip resonators; microwave resonators; surface resistance; textiles; wearable electrical systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2009. APMC 2009. Asia Pacific
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2801-4
  • Electronic_ISBN
    978-1-4244-2802-1
  • Type

    conf

  • DOI
    10.1109/APMC.2009.5385236
  • Filename
    5385236