DocumentCode :
3183454
Title :
Measurement of the surface resistance of conductive textiles at microwave frequency
Author :
Shimasaki, Hitoshi ; Nakagawa, Toshihisa ; Akiyama, Masahiro
Author_Institution :
Dept. of Electron., Kyoto Inst. of Technol., Matsugasaki, Japan
fYear :
2009
fDate :
7-10 Dec. 2009
Firstpage :
2580
Lastpage :
2583
Abstract :
Textile samples which consist of conductive threads are characterized in a microwave frequency range. The configurations of the threads used in this study are traditional ones which have no metallic wires or filaments and have been used in decoration in clothing for hundred years. A half-wavelength microstrip line resonator is fabricated and the Q factors are measured for a copper strip line and for the strip of sample textile from the frequency responses. Difference of Q factors in the two cases leads to the relationship between the surface resistances of the sample and a copper sheet. Then the surface resistances of the samples as conductive sheets are listed and compared. It is found that the relative resistivity is less than four for some textiles. These conductive textiles using a traditional technology are expected to use in wearable electrical systems.
Keywords :
microstrip lines; microstrip resonators; textiles; Q factors; clothing; conductive sheets; conductive textile surface resistance; conductive threads; copper sheet; copper strip line; half-wavelength microstrip line resonator; microwave frequency; relative resistivity; wearable electrical systems; Conductivity measurement; Copper; Electrical resistance measurement; Frequency measurement; Microwave frequencies; Microwave measurements; Q factor; Surface resistance; Textiles; Yarn; Conductive threads; microstrip resonators; microwave resonators; surface resistance; textiles; wearable electrical systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2009. APMC 2009. Asia Pacific
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2801-4
Electronic_ISBN :
978-1-4244-2802-1
Type :
conf
DOI :
10.1109/APMC.2009.5385236
Filename :
5385236
Link To Document :
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