Title :
Totally Self Checking FSM Based on Convolutional Codes
Author :
Li, Ming ; Wan, Fa-Yu ; Jiang, Jin-Sai ; Peng, Ming-Ming
Author_Institution :
Microelectron. R&D Center, Shanghai Univ., Shanghai
Abstract :
In this paper a new technique for designing totally self- checking finite state machines is presented using convolutional codes. In order to correct the fault, we propose a novel scheme which can not only detect, but also correct errors occurred in FSM transition. More specifically, we demonstrate the FSMs hardware which can be reused based on convolutional code partitioning and we formulate the optimization problem of maximizing hardware reusability. Synthesis results produced by our proposed procedure for the MCNC´89 FSM benchmark circuits show an average 20% reduction in literal counts compared to previous techniques. Moreover, we realize the IP core of the self-checking module by SMIC 0.25 mum technology and also simulate its function in FPGA.
Keywords :
CMOS logic circuits; circuit optimisation; convolutional codes; field programmable gate arrays; finite state machines; logic partitioning; CMOS technology; FPGA; FSM hardware; FSM transition; MCNC´89 FSM benchmark circuits; SMIC; convolutional code partitioning; hardware reusability maximization; optimization problem; self checking FSM; self-checking FSM synthesis technique; self-checking module; totally self-checking finite state machines; Automata; Circuit faults; Circuit simulation; Circuit synthesis; Convolutional codes; Electrical fault detection; Error correction; Fault detection; Field programmable gate arrays; Hardware;
Conference_Titel :
High Density packaging and Microsystem Integration, 2007. HDP '07. International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-1252-8
Electronic_ISBN :
1-4244-1253-6
DOI :
10.1109/HDP.2007.4283638