• DocumentCode
    3183575
  • Title

    Accelerating Statistical LOR Estimation for a High-Resolution PET Scanner Using FPGA Devices and a High Level Synthesis Tool

  • Author

    Chen, Zhong-Ho ; Su, Alvin W Y ; Sun, Ming-Ting ; Hauck, Scott

  • Author_Institution
    Dept. of CSIE, Nat. Cheng-Kung Univ., Tainan, Taiwan
  • fYear
    2011
  • fDate
    1-3 May 2011
  • Firstpage
    105
  • Lastpage
    108
  • Abstract
    In this paper, we use an FPGA platform and a high level synthesis tool, called Impulse C, to speedup a statistical Line Of Reaction (LOR) estimation for a high-resolution Positron Emission Tomography (PET) scanner. The estimation algorithm provides a significant improvement over conventional methods, but the execution time is too long to be practical for clinic applications. Impulse C allows us to rapidly map a C program into a platform with a host processor coupled to an FPGA device. However, the generated HDLs from the original codes are very inefficient, and the execution time is even worse than the software code. We describe some optimization methods for the algorithm using Impulse C. These methods could also be applied to other applications or used to improve the high level synthesis tools. The results show that the FPGA implementation can obtain a 82× speedup over the optimized software.
  • Keywords
    field programmable gate arrays; high level synthesis; medical computing; optimisation; positron emission tomography; statistical analysis; C program; FPGA devices; Impulse C; high level synthesis tool; high-resolution PET scanner; high-resolution positron emission tomography scanner; optimization method; statistical LOR estimation; statistical line of reaction estimation; Crystals; Detectors; Estimation; Field programmable gate arrays; Pipeline processing; Positron emission tomography; Software; FPGA; High Level Synthesis; LOR estimation; PET scanner;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Field-Programmable Custom Computing Machines (FCCM), 2011 IEEE 19th Annual International Symposium on
  • Conference_Location
    Salt Lake City, UT
  • Print_ISBN
    978-1-61284-277-6
  • Electronic_ISBN
    978-0-7695-4301-7
  • Type

    conf

  • DOI
    10.1109/FCCM.2011.15
  • Filename
    5771259