• DocumentCode
    318409
  • Title

    The fail-stop controller AE11

  • Author

    Böhl, E. ; Lindenkreuz, Th. ; Stephan, R.

  • Author_Institution
    Autom. Equip. Div., Robert Bosch GmbH, Reutlingen, Germany
  • fYear
    1997
  • fDate
    1-6 Nov 1997
  • Firstpage
    567
  • Lastpage
    577
  • Abstract
    Using on-chip fault detection measures the fail-stop controller. AE11 was developed for safety critical applications aiming at high volume production of automotive and railway electronics. The trade-off between high defect coverage, short reaction time to faults and low chip area overhead results in a combination of concurrent checking, built-in self-test and built-in current-monitoring (IDDQ-test)
  • Keywords
    automotive electronics; built-in self test; controllers; fault location; railways; safety systems; AE11; IDDQ-test; automotive electronics; built-in current-monitoring; built-in self-test; chip area overhead; concurrent checking; defect coverage; fail-stop controller; high volume production; on-chip fault detection; railway electronics; reaction time; safety critical applications; Automatic testing; Automotive engineering; Built-in self-test; Circuit faults; Fault detection; Hardware; Monitoring; Power capacitors; Railway safety; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1997. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-4209-7
  • Type

    conf

  • DOI
    10.1109/TEST.1997.639665
  • Filename
    639665
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=318409