Title :
P1149.4-problem or solution for mixed-signal IC design?
Author :
Sunter, Stephen K.
Author_Institution :
LogicVision Inc., Ottawa, Ont., Canada
Abstract :
The issue of whether the proposed P1149.4 Standard for a Mixed-Signal Test Bus will be a net benefit to board level design and test seems to be more or less settled: for the extremely dense circuit boards which will be commonplace in five years, and in today´s multi-chip modules, P1149.4 offers a solution where no other exists. P1149.4 was aimed at solving test issues for these mixed-signal boards. For boards which do not have test access issues, P1149.4 may not be worth its costs. So the key question about the proposed P1149.4 Standard is whether it will be a net benefit for IC designers, without considering the system-level benefits
Keywords :
design for testability; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; multichip modules; standards; IC design; P1149.4 standard; board level design; dense circuit boards; mixed-signal test bus; multi-chip modules; test access issues; Testing;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639671
