DocumentCode :
318414
Title :
Diagnosis of bridging faults in sequential circuits using adaptive simulation, state storage, and path-tracing
Author :
Venkataraman, Srikanth ; Fuchs, W. Kent
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
fYear :
1997
fDate :
1-6 Nov 1997
Firstpage :
878
Lastpage :
886
Abstract :
A diagnosis technique that integrates the storage of precomputed information with some dynamic computation for the diagnosis of bridging faults in synchronous sequential circuits with no-scan or partial-scan is presented. The method addresses the accuracy, storage requirements, and computational complexity required for diagnosis. A combination of adaptively simulating the behavior of a bridging fault and storing faulty state information at select vectors ensures accuracy with low storage requirements. The combination of adaptive simulation, state storage, and pathtracing has low computational requirements. Experimental results are provided for the ISCAS89 benchmark circuits
Keywords :
CMOS logic circuits; computational complexity; digital simulation; fault diagnosis; logic testing; sequential circuits; ISCAS89 benchmark circuits; adaptive simulation; bridging faults; computational complexity; computational requirements; diagnosis technique; no-scan; partial-scan; path-tracing; state storage; storage requirements; synchronous sequential circuits; CMOS logic circuits; CMOS technology; Circuit faults; Circuit simulation; Computational modeling; Computer simulation; Dictionaries; Fault diagnosis; Semiconductor device modeling; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-4209-7
Type :
conf
DOI :
10.1109/TEST.1997.639702
Filename :
639702
Link To Document :
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