• DocumentCode
    318414
  • Title

    Diagnosis of bridging faults in sequential circuits using adaptive simulation, state storage, and path-tracing

  • Author

    Venkataraman, Srikanth ; Fuchs, W. Kent

  • Author_Institution
    Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
  • fYear
    1997
  • fDate
    1-6 Nov 1997
  • Firstpage
    878
  • Lastpage
    886
  • Abstract
    A diagnosis technique that integrates the storage of precomputed information with some dynamic computation for the diagnosis of bridging faults in synchronous sequential circuits with no-scan or partial-scan is presented. The method addresses the accuracy, storage requirements, and computational complexity required for diagnosis. A combination of adaptively simulating the behavior of a bridging fault and storing faulty state information at select vectors ensures accuracy with low storage requirements. The combination of adaptive simulation, state storage, and pathtracing has low computational requirements. Experimental results are provided for the ISCAS89 benchmark circuits
  • Keywords
    CMOS logic circuits; computational complexity; digital simulation; fault diagnosis; logic testing; sequential circuits; ISCAS89 benchmark circuits; adaptive simulation; bridging faults; computational complexity; computational requirements; diagnosis technique; no-scan; partial-scan; path-tracing; state storage; storage requirements; synchronous sequential circuits; CMOS logic circuits; CMOS technology; Circuit faults; Circuit simulation; Computational modeling; Computer simulation; Dictionaries; Fault diagnosis; Semiconductor device modeling; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1997. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-4209-7
  • Type

    conf

  • DOI
    10.1109/TEST.1997.639702
  • Filename
    639702