Title :
Embedded at-speed test probe
Author_Institution :
Integrated Instrum. Group, Tekronix Inc., Beaverton, OR, USA
Abstract :
The addition of a small analog probe circuit to an ASIC design allows previously unreachable internal signal nodes of the ASIC to be accurately monitored and measured with conventional test equipment. The probe is essentially a high-performance analog multiplexer, that can connect to up to 16 test points inside the core of the ASIC with minimal loading, and buffer these signals accurately to a transmission line driver output connected to a dedicated pad. A 0.65μ CMOS implementation of the probe circuit provides a -3 dB bandwidth in excess of 400 MHz
Keywords :
CMOS analogue integrated circuits; application specific integrated circuits; design for testability; integrated circuit testing; multiplexing equipment; probes; -3 dB bandwidth; 0.65 micron; 400 MHz; ASIC design; CMOS implementation; analog multiplexer; analog probe circuit; at-speed test probe; dedicated pad; internal signal nodes; loading; test equipment; transmission line driver output; Application specific integrated circuits; Circuit testing; Distributed parameter circuits; Driver circuits; Monitoring; Multiplexing; Probes; Signal design; Test equipment; Transmission line measurements;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639708
