DocumentCode :
3184187
Title :
Open circuit voltage losses in multicrystalline silicon: an investigation by mini solar cells (MSC)
Author :
Baldner, R. ; Lautenschlager, H. ; Schetter, C. ; Schindler, R. ; Warta, W.
Author_Institution :
Fraunhofer-Inst. fur Solare Energiesyst., Freiburg, Germany
fYear :
1996
fDate :
13-17 May 1996
Firstpage :
641
Lastpage :
644
Abstract :
Mini solar cell arrays allow all relevant solar cell parameters, including V0C, ISC and efficiency to be locally measured. From individual mini solar cells, larger ensembles can be constructed by means of parallel connection. The data of individual and connected cells can be used to test models for multicrystalline Si solar cells
Keywords :
electric current measurement; elemental semiconductors; semiconductor device testing; short-circuit currents; silicon; solar cell arrays; solar cells; voltage measurement; Si; efficiency; local measurements; mini solar cell arrays; multicrystalline Si solar cells; open-circuit voltage; parallel connection; semiconductor; short-circuit current; solar cell parameters measurement; Building integrated photovoltaics; Charge carrier lifetime; Control systems; Etching; Grain boundaries; Photovoltaic cells; Short circuit currents; Silicon; Surfaces; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
ISSN :
0160-8371
Print_ISBN :
0-7803-3166-4
Type :
conf
DOI :
10.1109/PVSC.1996.564210
Filename :
564210
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3184187
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