• DocumentCode
    3184187
  • Title

    Open circuit voltage losses in multicrystalline silicon: an investigation by mini solar cells (MSC)

  • Author

    Baldner, R. ; Lautenschlager, H. ; Schetter, C. ; Schindler, R. ; Warta, W.

  • Author_Institution
    Fraunhofer-Inst. fur Solare Energiesyst., Freiburg, Germany
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    641
  • Lastpage
    644
  • Abstract
    Mini solar cell arrays allow all relevant solar cell parameters, including V0C, ISC and efficiency to be locally measured. From individual mini solar cells, larger ensembles can be constructed by means of parallel connection. The data of individual and connected cells can be used to test models for multicrystalline Si solar cells
  • Keywords
    electric current measurement; elemental semiconductors; semiconductor device testing; short-circuit currents; silicon; solar cell arrays; solar cells; voltage measurement; Si; efficiency; local measurements; mini solar cell arrays; multicrystalline Si solar cells; open-circuit voltage; parallel connection; semiconductor; short-circuit current; solar cell parameters measurement; Building integrated photovoltaics; Charge carrier lifetime; Control systems; Etching; Grain boundaries; Photovoltaic cells; Short circuit currents; Silicon; Surfaces; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.564210
  • Filename
    564210
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3184187