• DocumentCode
    3184212
  • Title

    TRENDS IN DEVICE SEE SUSCEPTIBILITY FROM HEAVY IONS

  • Author

    Nichols, D.K. ; McCarty, K.P. ; Schwartz, H.R. ; Swift, G.M. ; Watson, R.K. ; Koga, R.

  • fYear
    1995
  • fDate
    34899
  • Firstpage
    1
  • Keywords
    Aerospace testing; Conferences; Error analysis; Guidelines; IEEE publications; Laboratories; Manufacturing; Nuclear and plasma sciences; Propulsion; Satellites;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 1995, NSREC '95 Workshop Record., 1995 IEEE
  • Print_ISBN
    0-7803-3100-1
  • Type

    conf

  • DOI
    10.1109/REDW.1995.483258
  • Filename
    483258