DocumentCode :
3184212
Title :
TRENDS IN DEVICE SEE SUSCEPTIBILITY FROM HEAVY IONS
Author :
Nichols, D.K. ; McCarty, K.P. ; Schwartz, H.R. ; Swift, G.M. ; Watson, R.K. ; Koga, R.
fYear :
1995
fDate :
34899
Firstpage :
1
Keywords :
Aerospace testing; Conferences; Error analysis; Guidelines; IEEE publications; Laboratories; Manufacturing; Nuclear and plasma sciences; Propulsion; Satellites;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop, 1995, NSREC '95 Workshop Record., 1995 IEEE
Print_ISBN :
0-7803-3100-1
Type :
conf
DOI :
10.1109/REDW.1995.483258
Filename :
483258
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3184212
