Title :
Single event effect proton and heavy ion test results in support of candidate NASA programs
Author :
LaBel, K. ; Moran, A. ; Hawkins, D. ; Sanders, A. ; Seidleck, C. ; Kim, H. ; Fomey, J. ; Stassinopoulos, E.G. ; Marshall, P. ; Dale, C. ; Barry, R.
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. The variety of analog and digital devices tested includes ADCs, DC-DC converters, DRAMs, linear devices, and microprocessors
Keywords :
errors; ion beam effects; proton effects; radiation hardening (electronics); space vehicle electronics; ADCs; DC-DC converters; DRAMs; NASA program; analog devices; digital devices; heavy ions; linear devices; microprocessors; protons; single event effects; spacecraft electronics; Aerospace electronics; Analog-digital conversion; Clocks; Electronic equipment testing; Field programmable gate arrays; NASA; Protons; Single event upset; Space vehicles; Test facilities;
Conference_Titel :
Radiation Effects Data Workshop, 1995, NSREC '95 Workshop Record., 1995 IEEE
Conference_Location :
Madison, WI
Print_ISBN :
0-7803-3100-1
DOI :
10.1109/REDW.1995.483259
