Title :
Matching structures for high yield amplifier design
Author :
Purviance, J. ; Brakensiek, W. ; Monteith, D. ; Ferguson, T.
Author_Institution :
Dept. of Electr. Eng., Idaho Univ., Moscow, ID, USA
Abstract :
Circuit yield is evaluated for the commonly used narrowband lumped- and distributed-parameter matching structures. It is shown that each structure has highest yield for load impedances in a given region on the Smith chart. A simple design chart is developed which gives the designer a high-yield matching structure for any given load impedance. Two examples illustrate its use.<>
Keywords :
field effect integrated circuits; hybrid integrated circuits; impedance matching; microwave amplifiers; microwave integrated circuits; Smith chart; design chart; distributed-parameter matching structures; examples; high yield amplifier design; high-yield matching structure; impedance matching; lumped parameter matching structures; Central Processing Unit; Costs; Frequency estimation; Impedance; Integrated circuit yield; Laboratories; MMICs; Manufacturing; Microwave amplifiers; Narrowband;
Conference_Titel :
Microwave Symposium Digest, 1988., IEEE MTT-S International
Conference_Location :
New York, NY, USA
DOI :
10.1109/MWSYM.1988.22054
