• DocumentCode
    3184623
  • Title

    Coherent population trapping in two electron three-level systems with aligned spins

  • Author

    Mompart, J. ; Corbalan, R. ; Roso, L.

  • Author_Institution
    Dept. de Fisica, Univ. Autonoma de Barcelona, Spain
  • fYear
    2003
  • fDate
    22-27 June 2003
  • Firstpage
    45
  • Abstract
    This work investigates the possibility of realizing coherent population trapping (CPT) in a two-electron three-level system with parallel spins. Making an analogy with solid-state physics, this study demonstrates that a V-type three-level system with two electrons can be described as a Λ-type three-level system for one single hole. Cancellation of the probe field absorption is obtained when the hole is placed in the dark state. Alternatively, in terms of the two-electron V-type system, the CPT condition is realized when one electron is placed in the ground state and the other one in the bright combination of the excited states. In addition, when the electron-electron Coulomb repulsion is taken into account, it is shown that this technique offers the possibility of measuring, with subnatural resolution, some superposition-state matrix elements of the electron-electron correlation that due to their time dependent nature are inaccessible by standard measuring procedures.
  • Keywords
    dark states; excited states; ground states; quantum optics; radiation pressure; aligned spins; coherent population trapping; dark state; electron-electron Coulomb repulsion; electron-electron correlation; excited states; ground state; parallel spins; probe field absorption; subnatural resolution; superposition-state matrix elements; two electron three-level systems; two-electron V-type system; Absorption; Charge carrier processes; Current measurement; Dark states; Electron traps; Physics; Probes; Solid state circuits; Stationary state; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics Conference, 2003. EQEC '03. European
  • Print_ISBN
    0-7803-7733-8
  • Type

    conf

  • DOI
    10.1109/EQEC.2003.1313902
  • Filename
    1313902