DocumentCode :
3184679
Title :
Fault location in shunt capacitor banks
Author :
Samineni, S. ; Labuschagne, C. ; Pope, J. ; Kasztenny, B.
Author_Institution :
Schweitzer Eng. Labs., Inc., Pullman, WA, USA
fYear :
2010
fDate :
March 29 2010-April 1 2010
Firstpage :
1
Lastpage :
5
Abstract :
Shunt capacitor banks (SCBs) are used in the electrical industry for power factor correction and voltage support. Over the years, the purpose of SCBs has not changed, but as new dielectric materials came to market, the fusing practices for these banks changed from externally fused to internally fused, fuseless, and finally to unfused. While the identification of faulty capacitor units is easy with an externally fused bank, it is more complex with the other types of fusing, making maintenance and fault investigation difficult and expensive. This paper presents a novel method to identify the faulted phase in all capacitor banks and the faulted phase and section in most capacitor banks. This method can reduce the time to identify faulty units by more than 80 percent in large capacitor banks.
Keywords :
dielectric materials; fault diagnosis; maintenance engineering; power capacitors; power factor correction; dielectric materials; electrical industry; fault investigation; fault location; faulty capacitor; maintenance; power factor correction; shunt capacitor banks; element; fuse; fuseless; unfused; unit;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Developments in Power System Protection (DPSP 2010). Managing the Change, 10th IET International Conference on
Conference_Location :
Manchester
Type :
conf
DOI :
10.1049/cp.2010.0346
Filename :
5522203
Link To Document :
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