Title :
A device structure for thin, light trapped epitaxial silicon solar cells
Author :
Aiken, Daniel J. ; Smith, David D. ; Barnett, Allen M.
Author_Institution :
Dept. of Electr. Eng., Delaware Univ., Newark, DE, USA
Abstract :
Thin silicon solar cell device performance is particularly sensitive to electrical and optical quality at the back of the active device. The device back surface must be both well passivated and highly reflective. Achieving both of these device goals is difficult with conventional thin layer epitaxial growth techniques, which require substrate thinning to incorporate an appropriate back surface structure. In this work, epitaxial lateral overgrowth has been used to produce thin crystalline silicon device structures on silicon substrates. This technique allows the growth of epitaxial layers over dielectric films, which addresses back surface optical and electrical requirements. This structure is also mechanically stable, since substrate thinning is not required. Thin epitaxial structures demonstrating enhanced absorption have been produced. These layers are continuous over 99% of the growth area, and are less than 30 μm thick
Keywords :
elemental semiconductors; liquid phase epitaxial growth; passivation; semiconductor epitaxial layers; semiconductor materials; semiconductor thin films; silicon; solar cells; Si; back surface passivation; electrical quality; epitaxial lateral overgrowth; epitaxial layers growth; highly reflective back surface; light trapped epitaxial silicon solar cells; mechanically stable structure; optical quality; silicon substrates; thin silicon solar cell performance; Crystallization; Dielectric substrates; Epitaxial growth; Epitaxial layers; Optical devices; Optical films; Optical sensors; Photovoltaic cells; Silicon devices; Surface structures;
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3166-4
DOI :
10.1109/PVSC.1996.564222