High resolution contouring for CAD data generation and verification

Author

Harding, Kevin G.

Author_Institution

Industrial Technol. Inst., Ann Arbor, MI, USA

fYear

1992

fDate

18-22 May 1992

Firstpage

1223

Abstract

Contouring methods related to design are described. The focus is the noncontact, optical-based methods. Problems encountered in using optical triangulation includes such issues as occlusions, loss of measurement over a step change, or signal loss due to large variations in surface reflectivity. There have been a great many advances in both scanning and staring triangulation contouring systems specifically aimed at removing these problems. The author reviews the pros and cons of some of the currently available scanning and static contouring method, and presents a comparison of results in addressing the limitations of the technology. Initial results of the use of full-field contouring based on structured lighting are presented, along with a review of the major concerns encountered in the generation of CAD data from this type

Keywords

CAD; engineering graphics; image processing; image recognition; CAD data generation; contouring; data verification; loss of measurement; occlusions; optical triangulation; scanning; signal loss; static contouring; structured lighting; surface reflectivity; Area measurement; Computer aided manufacturing; Density measurement; Design automation; Electronic circuits; Industrial relations; Optical sensors; Process design; Prototypes; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Aerospace and Electronics Conference, 1992. NAECON 1992., Proceedings of the IEEE 1992 National

Conference_Location

Dayton, OH

Print_ISBN

0-7803-0652-X

Type

conf

DOI

10.1109/NAECON.1992.220582

Filename

220582