DocumentCode
3185594
Title
Restoration of noisy scanning tunneling microscope images
Author
van Kempen, G.M.P. ; Scholte, P.M.L.O. ; Young, I.T. ; Tuinstra, F.
Author_Institution
Fac. of Appl. Phys., Delft Univ. of Technol., Netherlands
fYear
1994
fDate
9-13 Oct 1994
Firstpage
134
Abstract
We have compared and improved several implementations of the Wiener filter to remove noise effects from scanning tunneling microscope (STM) images. We have found that the implementation of Weisman et al. (1992), using the noise model of Stoll et al. (1987), provides the best performance on both simulated and real STM images
Keywords
scanning tunnelling microscopy; Wiener filter; image restoration; noise model; noisy images; scanning tunneling microscope images; Additive noise; Atomic measurements; Fourier transforms; Frequency; Image restoration; Low-frequency noise; Microscopy; Noise measurement; Tunneling; Wiener filter;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 1994. Vol. 3 - Conference C: Signal Processing, Proceedings of the 12th IAPR International Conference on
Conference_Location
Jerusalem
Print_ISBN
0-8186-6275-1
Type
conf
DOI
10.1109/ICPR.1994.577138
Filename
577138
Link To Document