DocumentCode :
3185619
Title :
Resonant sensors for high accuracy pressure measurement using silicon technology
Author :
Parson, P. ; Glendinning, A. ; Angelidis, D.
Author_Institution :
Schlumberger Ind., Farnborough, UK
fYear :
1992
fDate :
18-22 May 1992
Firstpage :
349
Abstract :
A resonant element transducer has been developed for aerospace applications using micromachined silicon technology. The sensor is a beam supported over a square diaphragm. The resonant frequency of the beam is proportional to the applied pressure on the diaphragm. The authors describe the process of sensor construction, report on its physical characteristics, and summarize the performance evaluations which have been conducted to determine resonance frequency quality factor, temperature coefficient, and temperature and pressure hysteresis
Keywords :
electric sensing devices; elemental semiconductors; micromechanical devices; pressure measurement; pressure sensors; pressure transducers; resonators; silicon; aerospace applications; micromachined Si technology; pressure hysteresis; pressure measurement; quality factor; resonant beam; resonant frequency; temperature coefficient; temperature hysteresis; Hysteresis; Pressure measurement; Q factor; Resonance; Resonant frequency; Sensor phenomena and characterization; Silicon; Structural beams; Temperature sensors; Transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1992. NAECON 1992., Proceedings of the IEEE 1992 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-0652-X
Type :
conf
DOI :
10.1109/NAECON.1992.220596
Filename :
220596
Link To Document :
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