DocumentCode :
318599
Title :
A Partitioned Circuit Analysis Fault-Diagnostic System with Learning Capability
Author :
Leung, Cheuk-Ho ; Kwok, Daniel P. ; Tam, Peter K S
Author_Institution :
Department of Electronic Engineering, Hong Kong Polytechnic
Volume :
1
fYear :
1992
fDate :
17-21 Feb 1992
Firstpage :
81
Lastpage :
86
Keywords :
Artificial intelligence; Circuit analysis; Circuit faults; Circuit testing; Electrical fault detection; Fault diagnosis; Libraries; Predictive models; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Control and Instrumentation, 1992. SICICI '92. Proceedings., Singapore International Conference on
Print_ISBN :
0-7803-0632-5
Type :
conf
DOI :
10.1109/SICICI.1992.641651
Filename :
641651
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=318599
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