• DocumentCode
    318599
  • Title

    A Partitioned Circuit Analysis Fault-Diagnostic System with Learning Capability

  • Author

    Leung, Cheuk-Ho ; Kwok, Daniel P. ; Tam, Peter K S

  • Author_Institution
    Department of Electronic Engineering, Hong Kong Polytechnic
  • Volume
    1
  • fYear
    1992
  • fDate
    17-21 Feb 1992
  • Firstpage
    81
  • Lastpage
    86
  • Keywords
    Artificial intelligence; Circuit analysis; Circuit faults; Circuit testing; Electrical fault detection; Fault diagnosis; Libraries; Predictive models; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control and Instrumentation, 1992. SICICI '92. Proceedings., Singapore International Conference on
  • Print_ISBN
    0-7803-0632-5
  • Type

    conf

  • DOI
    10.1109/SICICI.1992.641651
  • Filename
    641651
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=318599