Title :
Analysis of neuronal cells of dissociated primary culture on high-density CMOS electrode array
Author :
Matsuda, Eiko ; Mita, Takeshi ; Hubert, Julien ; Bakkum, Douglas ; Frey, Urs ; Hierlemann, Andreas ; Takahashi, Hiroki ; Ikegami, Tomoaki
Author_Institution :
Dept. of Arts & Sci., Univ. of Tokyo, Tokyo, Japan
Abstract :
Spontaneous development of neuronal cells was recorded around 4-34 days in vitro (DIV) with high-density CMOS array, which enables detailed study of the spatio-temporal activity of neuronal culture. We used the CMOS array to characterize the evolution of the inter-spike interval (ISI) distribution from putative single neurons, and estimate the network structure based on transfer entropy analysis, where each node corresponds to a single neuron. We observed that the ISI distributions gradually obeyed the power law with maturation of the network. The amount of information transferred between neurons increased at the early stage of development, but decreased as the network matured. These results suggest that both ISI and transfer entropy were very useful for characterizing the dynamic development of cultured neural cells over a few weeks.
Keywords :
CMOS integrated circuits; biological techniques; cellular biophysics; electrodes; entropy; neural nets; neurophysiology; spatiotemporal phenomena; CMOS array; ISI distribution; cellular development stage; cultured neural cell; dissociated primary culture; high density CMOS electrode array; in vitro cell development; information transfer; interspike interval distribution; network maturation; network structure estimation; neuronal cell analysis; neuronal culture spatiotemporal activity; power law; putative single neuron; spontaneous neuronal cell development; time 4 day to 34 day; transfer entropy analysis; Arrays; CMOS integrated circuits; Cells (biology); Entropy; Network topology; Neurons; Topology; Action Potentials; Animals; Cells, Cultured; Electrodes; Entropy; Metals; Nerve Net; Neural Networks (Computer); Neurons; Oxides; Rats; Rats, Wistar; Semiconductors;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location :
Osaka
DOI :
10.1109/EMBC.2013.6609683