Title :
Single event upset and latchup measurements in avionics devices using the WNR neutron beam and a new neutron-induced latchup model
Author :
Normand, E. ; Wert, J.L. ; Majewski, P.P. ; Oberg, D.L. ; Bartholet, W.G. ; Davis, S.K. ; Shoga, M. ; Wender, S.A. ; Gavron, A.
Author_Institution :
Boeing Defense & Space Group, Seattle, WA, USA
Abstract :
Microelectronic devices used in avionics were tested in the WNR beam, simulating atmospheric neutrons. The SEU upset rates for ARINC 429 receivers agree with rates in memories, and neutron-induced latchup was measured in the LCA100 K and 200 K gate arrays and compared against a new neutron-induced latchup model
Keywords :
avionics; errors; neutron effects; radiation hardening (electronics); ARINC 429 receivers; LCA100 K gate arrays; LCA200 K gate arrays; WNR neutron beam; atmospheric neutrons; avionics; latchup; memories; microelectronic devices; single event upset; Aerospace electronics; Circuit testing; Large scale integration; Logic devices; Logic testing; Monitoring; Particle beams; Performance evaluation; Single event upset; System testing;
Conference_Titel :
Radiation Effects Data Workshop, 1995, NSREC '95 Workshop Record., 1995 IEEE
Conference_Location :
Madison, WI
Print_ISBN :
0-7803-3100-1
DOI :
10.1109/REDW.1995.483373
