• DocumentCode
    3186698
  • Title

    Radiation effects in Micrel MIC4427 MOSFET drivers

  • Author

    Skipper, M.D. ; Atkins, K. ; Hopkinson, G.R. ; LaBel, K.A.

  • Author_Institution
    Sira Ltd., Chislehurst, UK
  • fYear
    1995
  • fDate
    34899
  • Firstpage
    50
  • Lastpage
    54
  • Abstract
    Results of Co-60 total dose and heavy-ion latch-up testing indicate that the MIC4427 is capable of being used as a CCD clock driver in low dose rate space environments, up to a total dose of >50 krad(Si)
  • Keywords
    BiCMOS digital integrated circuits; driver circuits; gamma-ray effects; integrated circuit testing; ion beam effects; space vehicle electronics; 5E4 rad; CCD clock driver; CCD imager driving; Co; Co-60 total dose testing; MIC4427 MOSFET drivers; Micrel Semiconductor; heavy-ion latchup testing; low dose rate space environments; radiation effects; Annealing; Charge coupled devices; Clocks; Instruments; MOSFET circuits; NASA; Packaging; Radiation effects; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 1995, NSREC '95 Workshop Record., 1995 IEEE
  • Conference_Location
    Madison, WI
  • Print_ISBN
    0-7803-3100-1
  • Type

    conf

  • DOI
    10.1109/REDW.1995.483376
  • Filename
    483376
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3186698