Title :
Bloch simulations towards direct detection of oscillating magnetic fields using MRI with spin-lock sequence
Author :
Nagahara, Shizue ; Kobayashi, Takehiko
Author_Institution :
Dept. of Electr. Eng., Kyoto Univ., Kyoto, Japan
Abstract :
A new MRI method using the spin-lock sequence has attracted wide attention because of its potential for detecting small oscillating magnetic fields. However, as the mechanism involved is complicated, we visualized the magnetization performance during the spin-lock sequence in order to better understand interaction of the spin-lock pulse and the externally applied oscillating magnetic fields by means of a fast-and-simple method using matrix operations to solve a time-dependent Bloch equation. To improve spin-lock imaging in the detection of small magnetic fields (in an fMRI experiment that modeled neural magnetic fields), we observed that the phenomenon decreases MR signals, which led us to investigate how spin-lock parameters cause the MR signal to decrease; based on this, we determined that MR signals decrease in oscillating magnetic fields that are resonant with the spin-lock pulse. We also determined that MR signals decrease is directly proportional to spin-lock duration. Our results suggest that MRI can feasibly detect oscillating magnetic fields directly by using of the spin-lock sequence.
Keywords :
biomedical MRI; image sequences; magnetisation; medical image processing; Bloch simulation; MR signals; MRI method; fast-simple method; magnetization performance; matrix operations; oscillating magnetic fields; small oscillating magnetic field detection; spin-lock imaging; spin-lock parameters; spin-lock pulse; spin-lock sequence; time-dependent Bloch equation; Magnetic resonance; Magnetic resonance imaging; Magnetization; Mathematical model; Visualization; Computer Simulation; Magnetic Fields; Magnetic Resonance Imaging; Signal Processing, Computer-Assisted; Spin Labels;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location :
Osaka
DOI :
10.1109/EMBC.2013.6609687