DocumentCode :
3186887
Title :
A new color assessment methodology using cluster-based features for skin lesion analysis
Author :
Vasconcelos, M.J.M. ; Rosado, L. ; Ferreira, M.
Author_Institution :
Fraunhofer Portugal AICOS, Porto, Portugal
fYear :
2015
fDate :
25-29 May 2015
Firstpage :
373
Lastpage :
378
Abstract :
Melanoma is considered the most dangerous form of skin cancer, however if detected in early stages there are high success rates of recovery, making prevention essential. The risk assessment of skin lesions usually follows the ABCD rule (asymmetry, border, color and dermoscopic structures). This paper presents a methodology to assess the number of ABCD rule colors of skin lesion images. It starts by extracting 660 color features and several feature selection and machine learning classification methods are tested in order to minimize classification errors. The developed methodology has the advantage of being adaptable to the dataset used. Two publicly available dermoscopic image datasets and one mobile acquired dataset were used to test the methodology, achieving accuracy rates of 77.75%, 81.38% and 93.55%, respectively, for ABCD rule color feature assessment.
Keywords :
cancer; feature extraction; feature selection; image classification; image colour analysis; learning (artificial intelligence); medical image processing; risk management; skin; ABCD rule color feature assessment; asymmetry-border-color and dermoscopic structure rules; classification error minimization; cluster-based features; color assessment methodology; color feature extraction; dermoscopic image datasets; feature selection; machine learning classification methods; melanoma; mobile acquired dataset; risk assessment; skin cancer; skin lesion analysis; skin lesion images; Accuracy; Feature extraction; Image color analysis; Lesions; Mobile communication; Skin; Support vector machines; Color Features; Image analysis; Melanoma; Teledermatology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information and Communication Technology, Electronics and Microelectronics (MIPRO), 2015 38th International Convention on
Conference_Location :
Opatija
Type :
conf
DOI :
10.1109/MIPRO.2015.7160298
Filename :
7160298
Link To Document :
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