DocumentCode
3186992
Title
Dynamics of femtosecond laser induced ionization in dielectrics
Author
Temnov, V.V. ; Sokolowski-Tinten, K. ; Zhou, P. ; Rethfeld, B. ; Gruzdev, V. ; von der Linde, D. ; Fedotova, O.M. ; Smirnova, T.V. ; Khasanov, O.K.
Author_Institution
Inst. for Laser & Plasma Phys., Essen Univ., Germany
fYear
2003
fDate
22-27 June 2003
Firstpage
165
Abstract
This study has developed a setup for femtosecond time-resolved imaging Mach-Zehnder interferometry. This interferometer is capable of measuring the electron concentration with temporal resolution of about 70 fs and a lateral spatial resolution of about 1 μm. A strong pump-pulse (Ti:sapphire, 800 nm, 40 fs) excites the sample whereas a co-propagating weak time-delayed probe-pulse (400 nm, 60 fs) experiences the changes of the refractive index induced by the pump pulse. Both the probe and the reference pulses pass through a high-resolution microscope objective and interfere in the image plane, where an interferogram is recorded by a CCD-camera. The application of a 2D-Fourier-transform technique allows to reconstruct the changes in the amplitude and phase of the probe pulses due to excitation of the sample with great accuracy. The experimental results are compared with the numerical simulation of ultrashort pulse propagation, which take into account self-focusing, dispersion and known ionization mechanisms.
Keywords
CCD image sensors; Fourier transform optics; dielectric materials; high-speed optical techniques; image reconstruction; light interferometry; optical dispersion; optical self-focusing; photoionisation; refractive index; 2D-Fourier-transform; 40 fs; 800 nm; Al2O3:Ti; CCD-camera; Mach-Zehnder interferometry; Ti:sapphire laser; dielectrics; electron concentration; femtosecond laser; ionization; lateral spatial resolution; microscope objective; optical dispersion; probe pulses; pump pulse; refractive index; self-focusing; time-resolved imaging; ultrashort pulse propagation; Dielectric measurements; Electrons; Interferometry; Ionization; Laser excitation; Microscopy; Probes; Pump lasers; Refractive index; Spatial resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics Conference, 2003. EQEC '03. European
Print_ISBN
0-7803-7733-8
Type
conf
DOI
10.1109/EQEC.2003.1314022
Filename
1314022
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