Title :
Waveguide-to-microstrip transitions for millimeter-wave applications
Author :
Shih, Y.-C. ; Ton, T.-N. ; Bui, L.Q.
Author_Institution :
Hughes Aircraft Co., Torrance, CA, USA
Abstract :
Design and test data are presented for waveguide-to-microstrip probe transitions that cover millimeter-wave frequencies from 26 to 110 GHz. The broadband design provides a good transition for full-waveguide bandwidth (40%). Because of the compact structure, the measured insertion loss contributed by the transition is less than 0.1 dB in Ka-band, less than 0.2 dB in Q-band and V-band, and less than 0.35 dB in W-band. These transitions are useful for the device and circuit characterisation of millimeter-wave MICs and MMICs.<>
Keywords :
integrated circuit testing; microwave integrated circuits; microwave measurement; probes; semiconductor device testing; strip line components; test equipment; 0.1 to 0.35 dB; 26 to 110 GHz; Ka-band; Q-band; V-band; W-band; broadband design; compact structure; insertion loss; microwave circuit characterisation; millimeter-wave applications; test data; testing applications; waveguide-to-microstrip probe transitions; Bandwidth; Circuits; Frequency; Insertion loss; Loss measurement; Millimeter wave measurements; Probes; Q measurement; Testing; Waveguide transitions;
Conference_Titel :
Microwave Symposium Digest, 1988., IEEE MTT-S International
Conference_Location :
New York, NY, USA
DOI :
10.1109/MWSYM.1988.22077
