Title :
BIT for intelligent system design and condition monitoring
Author :
Gao, Robert X. ; Suryavanshi, Abhijit P.
Author_Institution :
Dept. of Mech. & Ind. Eng., Massachusetts Univ., Amherst, MA, USA
Abstract :
The rapid growth of process automation requires that more efficient and reliable system testing and fault diagnosis techniques be developed to reduce machine down time and enhance productivity. As a design philosophy built-in-test (BIT) is receiving increasing attention. This paper presents an overview of diverse BIT applications in several areas of industry, including manufacturing, aerospace, and transportation
Keywords :
aerospace industry; automobile industry; automotive electronics; avionics; built-in self test; computerised monitoring; condition monitoring; fault diagnosis; integrated circuit testing; machine testing; manufacturing industries; process monitoring; reviews; BIT applications; aerospace industry; automotive applications; avionics; condition monitoring; enhanced productivity; industrial applications; intelligent system design; machine fault diagnosis; manufacturing industry; mixed mode BIT; process monitoring; process optimization; reliable system testing; semiconductor chip testing; test pattern generation; Aerospace industry; Condition monitoring; Fault diagnosis; Intelligent systems; Machine intelligence; Machinery production industries; Manufacturing automation; Manufacturing industries; Productivity; System testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.929458
