• DocumentCode
    3187290
  • Title

    Electrically tunable substrate integrated waveguide reflective cavity resonator

  • Author

    He, Fanfan ; Chen, Xiao-Ping ; Wu, Ke ; Hong, Wei

  • Author_Institution
    Poly-Grames Res. Center, Center for Radiofreq. Electron. Res. of Quebec (CREER), Montreal, QC, Canada
  • fYear
    2009
  • fDate
    7-10 Dec. 2009
  • Firstpage
    119
  • Lastpage
    122
  • Abstract
    This paper presents a novel electronically tunable substrate integrated waveguide (SIW) cavity resonator at microwave frequency. The resonant frequency of the cavity is tuned with different DC biasing voltages applied over a varactor coupled to the cavity. This structure has been analyzed with a full-wave software package. To validate our analysis, an X-band reflective tunable SIW cavity resonator is designed and fabricated as an experimental example. Measured results show that the tuning range of the resonator is about 160 MHz with loaded QL of 150. The proposed resonator can be used to design tunable devices such as microwave and millimeter-wave voltage controlled oscillator (VCO).
  • Keywords
    cavity resonators; substrate integrated waveguides; varactors; voltage-controlled oscillators; DC biasing voltages; VCO; X-band reflective tunable SIW cavity resonator; electrically tunable substrate integrated waveguide; full-wave software package; microwave frequency; microwave voltage controlled oscillator; millimeter-wave voltage controlled oscillator; reflective cavity resonator; resonant frequency; tunable devices; tuning range; varactor; Cavity resonators; Microwave devices; Microwave frequencies; Q measurement; Resonant frequency; Software packages; Tuning; Varactors; Voltage; Voltage-controlled oscillators; substrate integrated waveguide (SIW); tunable resonator; varactor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2009. APMC 2009. Asia Pacific
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2801-4
  • Electronic_ISBN
    978-1-4244-2802-1
  • Type

    conf

  • DOI
    10.1109/APMC.2009.5385418
  • Filename
    5385418