Voltage sag ride-through for adjustable speed drives with active rectifiers

Author

Van Zyl, Annabelle ; Spée, René ; Faveluke, Alex ; Bhowmik, Shibashis

Author_Institution

Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA

Volume

1

fYear

1997

fDate

5-9 Oct 1997

Firstpage

486

Abstract

Adjustable speed drives (ASDs) trip due to voltage sags, interfering with production and incurring financial losses. In this paper, a methodology for incorporating voltage sag ride-through in the design of ASDs with active rectifiers is presented. The magnitude of the voltage sag for which ride-through can be provided is determined by the current rating of the active rectifier and load condition of the ASD but a sag of any duration can be compensated for

Keywords

AC-DC power convertors; machine testing; machine theory; power supplies to apparatus; power system transients; rectifying circuits; variable speed drives; active rectifiers; adjustable speed drives; current rating; load condition; power supplies; voltage sag magnitude; voltage sag ride-through; Low voltage; Manufacturing; Power quality; Power supplies; Power system stability; Production; Rectifiers; Variable speed drives; Voltage control; Voltage fluctuations;

fLanguage

English

Publisher

ieee

Conference_Titel

Industry Applications Conference, 1997. Thirty-Second IAS Annual Meeting, IAS '97., Conference Record of the 1997 IEEE

Conference_Location

New Orleans, LA

ISSN

0197-2618

Print_ISBN

0-7803-4067-1

Type

conf

DOI

10.1109/IAS.1997.643067

Filename

643067