Title :
Sub-picosecond aperture uncertainty measurements
Author :
Chiorboli, Giovanni
Author_Institution :
Dipt. di Ingegneria dell´´Inf., Parma Univ., Italy
Abstract :
Sub-picosecond aperture uncertainty measurement is nowadays a challenge in the test of state-of-the-art high-speed high-resolution A/D converters. This work describes the existing techniques and analyzes the limits in the measurement accuracy obtainable with the double-channel techniques and the instrumentation available today. Preliminary experiment results are provided
Keywords :
analogue-digital conversion; high-speed integrated circuits; integrated circuit measurement; jitter; phase noise; double-channel techniques; high-resolution A/D converters; high-speed ICs; measurement accuracy; sub-picosecond aperture uncertainty measurements; Analog-digital conversion; Apertures; Area measurement; Frequency conversion; Jitter; Measurement uncertainty; Noise measurement; Phase measurement; Phase noise; Testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.929493
