Spectral iterative techniques for the full-wave 3D analysis of (M)MIC structures

As an alternative to conventional moment methods, spectral iterative techniques (SITs) are introduced for the full-wave 3-D analysis of microwave integrated circuit (MIC) and monolithic MIC (MMIC) structures. A spectral-domain integral operator formulation is used in analogy to standard scattering problems. The iterative computational techniques used avoid the handling of large matrix equations otherwise required in the treatment of complex geometries. Computation time is reduced considerably and the capability of analyzing irregular microstrip structures is obtained for problems exceeding the scope of moment methods.<>