Title :
Selecting test frequencies for two-tone phase plane analysis of ADC´s
Author_Institution :
Bechtel Nevada, Las Vegas, NV, USA
Abstract :
We show how to select the frequencies for a two-tone sinewave test of an analog to digital converter. The frequencies are selected in a manner to guarantee nearly uniform coverage of a selected ellipse in the phase plane. A proof that the selected frequencies provide the desired coverage is given
Keywords :
analogue-digital conversion; circuit testing; ADC testing; analog to digital converter; test frequencies selection; two-tone phase plane analysis; two-tone sinewave test; Analog-digital conversion; Character recognition; Circuit testing; Contracts; Error correction; Frequency conversion; Iron; Phase distortion;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.929518
