• DocumentCode
    3188226
  • Title

    Selecting test frequencies for two-tone phase plane analysis of ADC´s

  • Author

    Blair, Jerome

  • Author_Institution
    Bechtel Nevada, Las Vegas, NV, USA
  • Volume
    3
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1843
  • Abstract
    We show how to select the frequencies for a two-tone sinewave test of an analog to digital converter. The frequencies are selected in a manner to guarantee nearly uniform coverage of a selected ellipse in the phase plane. A proof that the selected frequencies provide the desired coverage is given
  • Keywords
    analogue-digital conversion; circuit testing; ADC testing; analog to digital converter; test frequencies selection; two-tone phase plane analysis; two-tone sinewave test; Analog-digital conversion; Character recognition; Circuit testing; Contracts; Error correction; Frequency conversion; Iron; Phase distortion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
  • Conference_Location
    Budapest
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-6646-8
  • Type

    conf

  • DOI
    10.1109/IMTC.2001.929518
  • Filename
    929518
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3188226