DocumentCode
3188372
Title
Proceedings. European Test Symposium. ETS 2005
fYear
2005
fDate
22-25 May 2005
Abstract
The following topics are dealt with: system-on-chip testing; integrated circuit testing; advances in fault and defect models; advanced test generation issues; low cost testing for advanced analog circuits; on-line and BIST techniques for MEMS; defect and dynamic fault testing; SRAM memory testing; validation and molecular electronics; fault diagnosis.
Keywords
SRAM chips; automatic test pattern generation; built-in self test; fault diagnosis; integrated circuit testing; logic testing; micromechanical devices; molecular electronics; system-on-chip; MEMS testing; SRAM memory testing; advanced test generation; analog circuits testing; automatic test pattern generation; built-in self-test; defect models; dynamic fault testing; fault detection; fault diagnosis; integrated circuit testing; logic testing; molecular electronics; system-on-chip testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2005. European
Conference_Location
Tallinn, Estonia
Print_ISBN
0-7695-2341-2
Type
conf
DOI
10.1109/ETS.2005.18
Filename
1429992
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