DocumentCode
3188489
Title
Foreword
fYear
2005
fDate
22-25 May 2005
Abstract
These proceedings contain all the papers presented at the symposium that have been selected from the set of papers submitted to the ´formal´ category. Indeed, authors sending their work to the symposium had the possibility to submit either to the ´formal´ category or to the ´informal´ category. Then, both categories were reviewed by the program committee but different evaluation criteria were used for each category. Only selected papers from the formal category were included to these IEEE proceedings.
Keywords
Circuit testing; Circuits and systems; Cities and towns; Electronic equipment testing; Europe; Microelectronics; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2005. European
Conference_Location
Tallinn, Estonia
Print_ISBN
0-7695-2341-2
Type
conf
DOI
10.1109/ETS.2005.25
Filename
1429996
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