• DocumentCode
    3188762
  • Title

    Using dummy bridging faults to define a reduced set of target faults

  • Author

    Pomeranz, Irith ; Reddy, Sudhakar M.

  • Author_Institution
    Sch. of ECE, Purdue Univ., West Lafayette, IN, USA
  • fYear
    2005
  • fDate
    22-25 May 2005
  • Firstpage
    42
  • Lastpage
    47
  • Abstract
    The large numbers of bridging faults in a circuit resulted in several approaches to the selection of a subset of faults as targets for test generation. These approaches do not guarantee that all the bridging faults (or even that all the bridging faults that are likely to occur) will be detected. We investigate a different approach to the selection of target bridging faults. The approach is based on the introduction of dummy bridging faults, which are not physical faults but whose tests detect large numbers of physical faults. We apply this approach to four-way bridging faults. When no approximations are made, the proposed approach selects a subset of faults such that if they are detected, all the four-way bridging faults are guaranteed to be detected. We also investigate approximations and a test generation approach for the selected faults.
  • Keywords
    automatic test pattern generation; fault simulation; integrated circuit testing; logic testing; automatic test pattern generation; dummy bridging faults; fault detection; fault diagnosis; integrated circuit testing; reduced target fault set; target bridging faults; test generation; Bridge circuits; Circuit faults; Circuit testing; Cities and towns; Electrical fault detection; Fault detection; Fault diagnosis; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2005. European
  • Print_ISBN
    0-7695-2341-2
  • Type

    conf

  • DOI
    10.1109/ETS.2005.45
  • Filename
    1430007