DocumentCode :
3188836
Title :
Variance of the cumulative histogram of ADCs due to frequency errors
Author :
Alegria, F. Corrêa ; Serra, A. Cruz
Author_Institution :
Dept. of Electr. & Comput. Eng., Inst. Superior Tecnico, Lisbon, Portugal
Volume :
3
fYear :
2001
fDate :
2001
Firstpage :
2021
Abstract :
The variance in the number of counts of the cumulative histogram, used for the characterization of ADCs with the histogram method, is calculated without any restrictions regarding frequency errors on the stimulus and sampling signals, number of periods periods of the stimulus signal and number of samples. This makes the approach here presented more general than the traditional one, used in IEEE 1057-1994 standard, where only a limited frequency error range is considered. The exact knowledge of this variance allows for a more efficient test of ADCs and a more precise determination of the uncertainty of the test result. Numerical simulation and experimental results that validate the theory are shown
Keywords :
analogue-digital conversion; calibration; higher order statistics; integrated circuit testing; measurement errors; measurement uncertainty; probability; signal sampling; ADC testing; IEEE 1057-1994 standard; cumulative histogram; frequency errors; number of counts variance; number of periods; number of samples; numerical simulation; sampling signals; stimulus signals; uncertainty; Analog-digital conversion; Clocks; Computer errors; Frequency conversion; Frequency estimation; Histograms; Probability density function; Sampling methods; Testing; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
ISSN :
1091-5281
Print_ISBN :
0-7803-6646-8
Type :
conf
DOI :
10.1109/IMTC.2001.929553
Filename :
929553
Link To Document :
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