Q-band computerized slotted line system

Author

An, Taehun ; Mao, James ; Meng, Qinghu ; Yan, Heng-Chao ; Fang, Jianwu

Author_Institution

Microwave Inst., East China Normal Univ., Shanghai, China

fYear

1988

fDate

25-27 May 1988

Firstpage

755

Lastpage

756

Abstract

An automatic test system for measuring network parameters at Q-band has been developed. The system is based on the conventional slotted line system and is controlled by the Apple II microcomputer. The principles, construction, and features of the system are presented. Typical results for complex reflection coefficient, voltage standing wave ratio, impedance, attenuation, and S-parameters are given. The system is expected to be valuable in developing test systems at the short-millimeter-wave band.<>

Keywords

automatic test equipment; computerised instrumentation; microcomputer applications; microcomputers; microwave measurement; Apple II microcomputer; EHF; MM-wave; Q-band; S-parameters; VSWR; attenuation; automatic test system; complex reflection coefficient; computerized slotted line system; construction; features; impedance; operation; principles; short-millimeter-wave band; voltage standing wave ratio; Attenuation; Automatic control; Automatic testing; Control systems; Impedance; Microcomputers; Q measurement; Reflection; System testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1988., IEEE MTT-S International

Conference_Location

New York, NY, USA

Type

conf

DOI

10.1109/MWSYM.1988.22141

Filename

22141