DocumentCode
3189031
Title
The determination of dielectric properties at near millimetre wavelengths
Author
Birch, J.R.
Author_Institution
Div. of Electr. Sci., NPL, Teddington, UK
fYear
1992
fDate
18-25 June 1992
Abstract
Summary form only given. The author discussed methods used for dielectric measurements on solids at near millimeter wavelengths over a range of temperatures from 4.2 to values in excess of 1500 K. The methods include both resonant and nonresonant techniques, and monochromatic and broadband ones. A comparison in which a number of such techniques were used in a study of the dielectric properties of a group of specimens was discussed.<>
Keywords
dielectric measurement; microwave measurement; 4.2 to 1500 K; broadband techniques; dielectric properties; monochromatic techniques; near millimetre wavelengths; nonresonant techniques; resonant techniques; solids; Biomedical optical imaging; Dielectric constant; Dielectric materials; Electromagnetic spectrum; Laboratories; Millimeter wave technology; Optical sensors; Radar applications; Radar remote sensing; Solids;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
Conference_Location
Chicago, IL, USA
Print_ISBN
0-7803-0730-5
Type
conf
DOI
10.1109/APS.1992.221411
Filename
221411
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