• DocumentCode
    3189201
  • Title

    Low power embedded DRAMs with high quality error correcting capabilities

  • Author

    Öhler, Philipp ; Hellebrand, Sybille

  • Author_Institution
    Inst. of Electr. Eng., Paderborn Univ., Germany
  • fYear
    2005
  • fDate
    22-25 May 2005
  • Firstpage
    148
  • Lastpage
    153
  • Abstract
    Embedded memories are part of almost any embedded system. To ensure an error free operation, error detecting/correcting codes or alternative schemes for on-line consistency checking can be used. The trade-offs with respect to error detection capabilities and hardware cost has been investigated in previous work. However, very often embedded systems also have to work with small batteries (e.g. mobile devices), and power consumption becomes a second crucial issue. In this paper a low power design for on-line consistency checking is proposed. The proposed scheme is analyzed with respect to its power consumption and compared to error detecting/correcting schemes based on error correcting codes. The results show that on-line consistency checking based on the modulo-2 address characteristic can ensure both low error detection latencies and reduced power consumption in contrast to alternative schemes.
  • Keywords
    DRAM chips; digital arithmetic; embedded systems; error detection codes; integrated circuit design; low-power electronics; memory architecture; embedded memories; error correcting codes; error detecting codes; error detection latencies; error free operation; low power embedded DRAM; modulo-2 address characteristic; online consistency checking; power consumption reduction; Batteries; Costs; Delay; Embedded system; Energy consumption; Error correction; Error correction codes; Error-free operation; Hardware; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2005. European
  • Print_ISBN
    0-7695-2341-2
  • Type

    conf

  • DOI
    10.1109/ETS.2005.28
  • Filename
    1430023