Title :
Convolutional compaction-driven diagnosis of scan failures
Author :
Mrugalski, Grzegorz ; Pogiel, Artur ; Rajski, Janusz ; Tyszer, Jerzy ; Wang, Chen
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR, USA
Abstract :
This paper describes a fault diagnosis technique for scan-based designs with convolutional test response compaction. The proposed approach allows a time-efficient and accurate identification of failing scan cells using Gauss Jordan elimination method.
Keywords :
boundary scan testing; built-in self test; fault simulation; integrated circuit testing; Gauss Jordan elimination method; convolutional test response compaction; failing scan cells; fault diagnosis; scan failures; scan-based designs; Compaction; Design for testability; Fault diagnosis; Flip-flops; Gaussian processes; Graphics; Hardware; Integrated circuit testing; Polynomials; Registers;
Conference_Titel :
Test Symposium, 2005. European
Print_ISBN :
0-7695-2341-2
DOI :
10.1109/ETS.2005.11
