DocumentCode
3189525
Title
Experimental Evaluation of Transient Effects on SRAM-based FPGA Chips
Author
Bakhoda, Ali ; Miremadi, Seyed Ghassem ; Zarandi, Hamid R.
Author_Institution
Dependable Systems Laboratory Department of Computer Engineering Sharif University of Technology Azadi Ave., Tehran, Iran bakhoda@ce.sharif.edu
fYear
2005
fDate
13-15 Dec. 2005
Firstpage
251
Lastpage
255
Abstract
This paper presents an experimental evaluation of transient effects on SRAM-based FPGAs. A total of 9000 transient faults were injected into the target FPGA using Power Supply Disturbances (PSD). The results show that nearly 60 percent of faults cause system failures and about 58 percent of the faults lead to corruption of the configuration data of the FPGA chip.
Keywords
Physical Fault Injection; Power Supply Disturbances; SRAM-Based FPGA; Transient Faults; Aerospace industry; Circuit faults; Electricity supply industry; Field programmable gate arrays; Laboratories; Power engineering and energy; Power supplies; Registers; Table lookup; Time to market; Physical Fault Injection; Power Supply Disturbances; SRAM-Based FPGA; Transient Faults;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 2005. ICM 2005. The 17th International Conference on
Print_ISBN
0-7803-9262-0
Type
conf
DOI
10.1109/ICM.2005.1590078
Filename
1590078
Link To Document