Title :
Vapor phase treatment of CdTe/CdS thin films with CdCl2:O2
Author :
McCandless, B.E. ; Hichri, H. ; Hanket, G. ; Birkmire, R.W.
Author_Institution :
Inst. of Energy Conversion, Delaware Univ., Newark, DE, USA
Abstract :
A controllable technique for treating CdTe/CdS thin film structures to produce uniform film properties and device performance is presented. Heat treatments of physical vapor deposited CdTe/CdS thin films were carried out in an atmosphere containing CdCl2 vapor and air, or mixtures of Ar and O2. The heat treatment reactor permitted independent control over the reaction temperature and the CdCl2 source temperature, hence CdCl2 vapor phase concentration at the CdTe surface. Modelling of the thermal and mass transfer for the reactor geometry shows that at total pressure of 1 atmosphere of air, the CdCl2 equilibrium concentration over the CdTe surface is established in less than 2 seconds and varies from 1.3 mtorr at 380°C to 32.7 mtorr at 450°C. The effects of treatment conditions on interdiffusion, grain coalescence, and device operation are presented. Devices with efficiency greater than 11% were obtained for treatment with a CdCl2 partial pressure of 9 mtorr in the temperature range 420-430°C and at oxygen partial pressures from 8 mtorr to 570 torr
Keywords :
II-VI semiconductors; cadmium compounds; chemical interdiffusion; heat transfer; heat treatment; mass transfer; semiconductor thin films; solar cells; 1 atm; 1.3 to 570 mtorr; 11 percent; 380 to 450 C; CdCl2 source temperature; CdCl2:O2; CdTe surface; CdTe-CdS; CdTe/CdS thin films; device performance; grain coalescence; heat treatment reactor; interdiffusion; mass transfer; oxygen partial pressures; physical vapor deposited thin films; reaction temperature; thermal transfer; thin film solar cells; treatment conditions; vapor phase treatment; Argon; Atmosphere; Atmospheric modeling; Heat treatment; Inductors; Sputtering; Surface treatment; Temperature control; Thin film devices; Transistors;
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3166-4
DOI :
10.1109/PVSC.1996.564244